Nonuniform Measurements: Enabling Critical Inspections
Tracks
Day of Tutorials
Monday, June 24, 2024 |
10:40 AM - 11:50 AM |
408-409 |
Overview
Dr. Toby Case | Aerospace Corporation, USA
Details
Most of the world performs measurements uniformly; however, some important applications for NDE require nonuniform measurement. Examples of uniform measurement are raster scans performed with uniform stepping and scanning, measurements across a bandwidth sampled at uniformly spaced frequencies, and, for computed tomography, x-ray images taken in a full circle at uniformly spaced angles. Signal processing, image processing, and reconstruction techniques are well-known and highly optimized for uniform measurements. For those well-versed in uniform measurements, there is the constant struggle of sampling sufficiently but not too much since one must reduce or eliminate aliasing artifacts yet not require so many samples as to exhaust memory resources or require prohibitively long data acquisition times. The alternative is nonuniform measurement. It is a technique that eliminates aliasing, reduces the required number of measurements, and may increase data acquisition throughput. Nonuniform measurement has at its heart nonuniform sampling theory, which is used extensively for compressive sensing. A brief, high-level introduction will be given for nonuniform signal processing, image processing, and reconstruction techniques where specific steps are taken to reconstruct uniform samples from nonuniform samples so that highly optimized techniques developed for uniform measurements may be applied. The cost of nonuniform measurement is increased computational complexity. However, this tutorial describes practical examples of NDE applications that are only made possible with nonuniform measurement. These examples specifically demonstrate how nonuniform measurements facilitate difficult inspections and can be used to close high impact inspection gaps.
Speaker
Dr. Toby Case
Aerospace Corporation
Nonuniform Measurements: Enabling Critical Inspections
Biography
Joseph T. Case received his Ph.D. in EE in 2013 from the Missouri University of Science and Technology (Missouri S&T) with an emphasis in microwave and millimeter wave imaging at The Applied Microwave Nondestructive Testing Laboratory (amntl) with Dr. Reza Zoughi as his advisor. He is currently a member of the technical staff at the Aerospace Corporation since 2014 and is proficient in all main NDE methods. He performs research in the Physical Sciences Laboratory in the field of nondestructive testing for x-ray, ultrasound, and more. He specializes in numerical methods, nonuniform sampling, signal and image processing, and reconstruction techniques (http://www.aerospace.org).