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Next-generation Quality Control with Real-time Metrology – A Data-driven Approach

Tracks
EXPERIENCE ZONE
Knowledge Level - NDT Level I/NDT Level II
Knowledge Level - NDT Level III
Presentation Topic Level - Intermediate
Target Audience - General Interest
Target Audience - Level III Managers
Thursday, October 9, 2025
10:15 AM - 10:45 AM
Monterey 1

Speaker

Kimberly Chan
Staff Engineer, Product Development
Sirenopt

Next-generation Quality Control with Real-time Metrology – A Data-driven Approach

Presentation Description

Advanced materials manufacturing suffers from several challenges including inherent stochasticity in the manufacturing process. Inherent stochasticity means that even with the same inputs and processes, the resulting material outputs follow a large distribution of performance and safety standards. Large distributions of material outputs mean that significant amounts of low-to-mid performing material are scrapped leading to millions of dollars in waste and overproduction.
Up until now, there have been only a few characterization tools that provide rich and meaningful insights in real-time for advanced materials manufacturing. Beta gauges are the industry standard for inline characterization, but they are limited to low coverage (less than 1%) and primarily one measurement, thickness. Vision systems are quickly advancing to uncover a limited set of surface defects, but are limited to what is optically visible, i.e., they cannot characterize sub-surface conditions, delamination, and/or micro- and nano-scale defects. Terahertz technology poses a multivariable option but is limited in its penetration depth and large-scale adoption.
To address some of these challenges that plague existing technologies, physics-rich, multimodal data combined with data-driven modeling will be a crucial component in next-generation materials characterization. Cold atmospheric plasma provides multi-modal excitation that generates information-dense data with several thousands of features. Machine learning provides a means to fill the data processing gap between these high-dimensional raw data features to interpretable metrics of interest, including a variety of material properties. We demonstrate this combination of plasma-generated data with machine learning-based processing to provide a flexible, real-time solution to next-generation metrology.

Short Course Description

Biography

Kimberly is the Staff Product Development Engineer at SirenOpt. Kimberly graduated with highest honors from Georgia Tech in 2018 and received a BS in Chemical Engineering. Afterwards, she received a PhD from the Department of Chemical and Biomolecular Engineering at the University of California, Berkeley. Her thesis was on learning-based control and optimization of cold atmospheric plasmas for biomedical applications, giving her a variety of systems-level expertise in plasma control and operation. During her PhD, she published and spoke at a variety of conferences and received several awards in teaching and mentorship.
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