Deep learning for CT inspection: industrial examples
Tracks
TECHNICAL SESSIONS
Knowledge Level - NDT Level III
Knowledge Level - Student
Presentation Topic Level - Intermediate
Target Audience - Research/Academics
Target Audience- NDT Engineers
Thursday, October 9, 2025 |
8:30 AM - 9:00 AM |
Yucatan 1-3 |
Speaker
Anton Du Plessis
Business Development Manager
Comet Technologies Canada Inc
Deep learning for CT inspection: industrial examples
Presentation Description
In the fast-paced world of industrial manufacturing, companies are under constant pressure to deliver more components, faster and with greater quality. This challenge spans a broad range of sectors, including battery production, consumer goods, pharmaceuticals, automotive and aerospace industries, and electronics. A crucial factor in meeting these demands is the ability to detect and prevent defects early in the manufacturing cycle, thereby ensuring reliable, high-performance products.
X-ray imaging, including both 2D inspection and 3D computed tomography (CT), has become an essential non-destructive tool for quality assurance, process optimization, and research and development. Central to these applications is the need for effective image segmentation to detect and quantify defects. In recent years, AI-driven segmentation techniques have gained traction, offering several advantages over traditional methods. These include minimizing operator bias, enabling the interpretation of complex or noisy datasets, and facilitating fully automated analysis workflows.
This presentation explores the current landscape of AI-based image segmentation in industrial contexts, highlighting its impact through practical case studies that demonstrate measurable benefits for manufacturers and researchers alike.
X-ray imaging, including both 2D inspection and 3D computed tomography (CT), has become an essential non-destructive tool for quality assurance, process optimization, and research and development. Central to these applications is the need for effective image segmentation to detect and quantify defects. In recent years, AI-driven segmentation techniques have gained traction, offering several advantages over traditional methods. These include minimizing operator bias, enabling the interpretation of complex or noisy datasets, and facilitating fully automated analysis workflows.
This presentation explores the current landscape of AI-based image segmentation in industrial contexts, highlighting its impact through practical case studies that demonstrate measurable benefits for manufacturers and researchers alike.
Short Course Description
Biography
Anton du Plessis is business development manager at Dragonfly software. He is also affiliated with Stellenbosch University as associate professor, and acts as editor in chief of the journal Tomography of Materials and Structures.
