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Automated NDE in Factories – Modular and Inter-Connected Systems

Tracks
ADVANCED UT with TPAC - CORONADO E-G
Knowledge Level - NDT Level I/NDT Level II
Knowledge Level - NDT Level III
Knowledge Level - Student
Presentation Topic Level - Advanced
Presentation Topic Level - Intermediate
Presentation Topic Level - Novice
Target Audience - General Interest
Target Audience - Level III Managers
Target Audience - Research/Academics
Target Audience- NDT Engineers
Target Audience- Technicians/Inspectors
Tuesday, October 7, 2025
11:30 AM - 12:00 PM
Coronado E-F - TPAC/AOS

Speaker

Dave Seto
Utex Scientific
Utex Scientific

Automated NDE in Factories – Modular and Inter-Connected Systems

Presentation Description

As manufacturing systems evolve toward ever increasing automation, the pressure to automate downstream processes—particularly product inspection—has also increased.
Non-Destructive Testing (NDT) and Evaluation (NDE) processes must keep pace with the speed, precision, process integration and data integration requirements in modern manufacturing environments.

This presentation explores how the automation of inspection processes is not merely a technical upgrade but a strategic necessity for maintaining quality, reducing downtime, and even for enabling closed-loop manufacturing.
Widespread adoption of open standards and interoperable architectures —such as OPC-UA - within the automation industry is shaping similar expectations for NDT/NDE systems. Stand-alone inspection systems with proprietary solutions are less viable in ecosystems that demand seamless data exchange, cross-platform compatibility, and scalable integration. Automation engineers and NDT systems builders must be able to deliver design inspection platforms that are modular, vendor-agnostic, and capable of interfacing with factory MRP, MES, SCADA, and cloud analytics platforms.

We will discuss the convergence of automation and interoperability as a transformative force in industrial NDT, with some examples of integrated inspection systems.

Attendees will learn how inspection technologies can evolve from isolated checkpoints to intelligent, integrated components within the automated factory.

Keywords: automation, robotics, metadata, open access, open format, NDE 4.0,

Biography

Dave Seto is the Director of Business Development for UTEX Scientific Instruments, based in Mississauga, Ontario Canada. Prior to this current role, Dave was a senior NDE applications developer, providing software and integration for automated inspection systems in nuclear power, aerospace, and space vehicle manufacturing. His more recent work has involved automating NDE systems using ultrasonic, eddy current, and microwave sensing technologies, while integrating these NDE processes within the factory wide manufacturing and automation ecosystem.
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